Publications

@article{Kim2024Access,

title = {Adversarial Defense on Harmony: Reverse Attack for Robust Models Against Adversarial Attack},

author = {Yebon Kim and Jinhyo Jung and Hyunjun Kim and Hwisoo So and Yohan Ko and Aviral Shrivastava and Kyoungwoo Lee and Uiwon Hwang},

url = {https://mpslab-asu.github.io/publications/papers/Hwisoo2024IEEE.pdf, pdf},

year  = {2024},

date = {2024-11-25},

urldate = {2024-11-25},

booktitle = {IEEE Access},

journal = {IEEE Access},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}

@article{so2023electronics,

title = {gemV-tool: A Comprehensive Soft Error Reliability Estimation Tool for Design Space Exploration},

author = {Hwisoo So and Yohan Ko and Jinhyo Jung and Kyoungwoo Lee and Aviral Shrivastava},

url = {https://mpslab-asu.github.io/publications/papers/Hwisoo2023Electronics.pdf, pdf},

year  = {2023},

date = {2023-11-08},

urldate = {2023-11-08},

journal = {Electronics 2023, 12(22), 4573},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}

@article{Didehban2023TDSC,

title = {Generic Soft Error Data and Control Flow Error Detection by Instruction Duplication},

author = {Moslem Didehban and Hwisoo So and Prudhvi Gali and Aviral Shrivastava and Kyoungwoo Lee},

url = {https://mpslab-asu.github.io/publications/papers/Didehban2023TDSC.pdf, paper},

year  = {2023},

date = {2023-02-14},

urldate = {2023-02-14},

journal = {IEEE Transactions on Dependable and Secure Computing},

volume = {1},

pages = {1-16},

abstract = {Transient faults or soft errors are considered one of the most daunting reliability challenges for microprocessors. Software solutions for soft error protection are attractive because they can provide flexible and effective error protection. For instance, nZDC [1] state-of-the-art instruction duplication error protection scheme achieves a high degree of error detection by verifying the results of memory write operations and utilizes an effective control-flow checking mechanism. However, nZDC control-flow checking mechanism is architecture-dependent and suffers from some vulnerability holes. In this work, we address these issues by substituting nZDC control-flow checking mechanism with a general (ISA-independent) scheme and propose two transformations, coarse-grained scheduling, and asymmetric control-flow signatures, for hard-to-detect control flow errors. Fault injection experiments on different hardware components of synthesizable Verilog description of an OpenRISC-based microprocessor reveal that the proposed transformation shows 85% less silent data corruptions compared to nZDC. In addition, programs protected by the proposed scheme run on average around 37% faster than nZDC-protected programs.},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}

@article{Jung2022JSA,

title = {Root cause analysis of soft-error-induced failures from hardware and software perspectives},

author = {Jinhyo Jung and Yohan Ko and Hwisoo So and Kyoungwoo Lee and Aviral Shrivastava},

url = {https://mpslab-asu.github.io/publications/papers/Jung2022JSA.pdf, pdf

},

year  = {2022},

date = {2022-07-08},

urldate = {2022-07-08},

journal = {Journal of Systems Architecture (JSA)},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}

@article{So2022TACO,

title = {EXPERTISE: An Effective Software-level Redundant Multithreading Scheme against Hardware Faults},

author = {Hwisoo So and Moslem Didehban and Yohan Ko and Aviral Shrivastava and Kyoungwoo Lee},

url = {https://mpslab-asu.github.io/publications/papers/So2022TACO.pdf, paper

},

year  = {2022},

date = {2022-07-05},

urldate = {2022-07-05},

journal = {ACM Transactions on Architecture and Code Optimization (TACO)},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}

@article{So2021ELECTRONICS,

title = {Revisiting Symptom-Based Fault Tolerant Techniques against Soft Errors},

author = {Hwisoo So and Moslem Didehban and Yohan Ko and Reiley Jeyapaul and Jongho Kim and Youngbin Kim and Kyoungwoo Lee and Aviral Shrivastava},

url = {https://mpslab-asu.github.io/publications/papers/So2021ELECTRONICS.pdf, pdf},

year  = {2021},

date = {2021-12-04},

urldate = {2021-12-04},

journal = {MDPI Electronics},

volume = {10},

number = {23},

keywords = {Reliability},

pubstate = {published},

tppubtype = {article}

}