5/23/2026 Congratulations to the team for the publication of the chapter in the book “Nanofabrication in the Era of Machine Learning” – Edited by Ampere Tseng for World Scientific
News
Nanofabrication in the Era of Machine Learning
Advances and Emerging Frontiers
https://doi.org/10.1142/14809
6/22/2026 Filippo attending the Symposium on VLSI Technology (VLSI 2026)
5/25/2026 Hosting Prof. Judit Lisoni from Universidad Austral de Chile, with visit to the Grand Canyon!
5/23/2026 Congratulations to MAR Laskar, S Chakrabarti, WA Hubbard for the publication of the chapter in the book “Nonvolatile Memory and Selector Devices: Technology and Applications” – Wiley-VCH
5/14/2026 Congratulations to the team for the cover of Nanoscale.
5/10/2026 Congratulations to Pranav Kumar Selva Kumar for his graduation!
5/5/2026 Congratulations to Filippo and the team at Molecular Vista for the whitepaper on the use of PiFM in Semiconductor Process Characterization (link)
5/5/2026 Congratulations to the whole team for the publication of:
Who needs an electrical back-contact after all?Nanoscale, 2026,
https://doi.org/10.1039/D5NR05523G
4/22/2026 Congrats to Onkar Vachista Falle, Arsha Jindal, Zixin Zhang (Sophie), and Gregory Feng for demoing our new XR-platform for the Celano lab navigation and training.
4/21/2026 Visiting the center on nanotechnologies applied to engineering of Sapienza (CNIS) with Dr. Proietti
4/13/2026 Congrats to Sakib and Sanchari on the publication of their chapter in the book “Magnetic Nano- and Microwires, Design, Synthesis, Properties and Applications” Edited by: Manuel Vázquez
4/8/2026 Congrats to Jose for presenting his work on correlative metrology with STEM-SPM at the 18th Annual FIB SEM Meeting.
4/6/2026 Congrats to Lorenzo Magnarin and the team for the paper “On the contrast mechanism of scanning microwave impedance microscopy on buried and doped features” – J. Vac. Sci. Technol. B 44, 034003 (2026)
3/23/2026 Dr. Filippo Giannazzo and Dr. Patrick Fiorenza (CNR-IMM, Italy) visit ASU !
3/18/2026 Closing a great FCMN in Monterey, congrats to Filippo and Lorenzo for the poster!
3/14/2026 Md Ashiqur Rahman Laskar joins Samsung US, congrats!
3/2/2026 Thanks Greg, Sophie (Zixin), Onkar and Arsha for scanning the whole Lab!
2/10/2026 Congrats to Juan Carlos Tarín (UPC, Barcelona) for his PhD defense
1/29/2026 Tec de Monterrey – ASU Visit
1/25/2026 Celano Lab group dinner for spring 2026, happy semester!
1/20/2026 Vikramaditya Tunukoju Venkatapuram joins the group, welcome!
1/20/2026 Vikramaditya Tunukoju Venkatapuram joins the group, welcome!
12/11/2025 IEEE IEDM meeting 2025 & End of the year lunch with the team!
12/3/2025 Calvin Quate Memorial – Dec 2-3 , Stanford
12/11/2025 ISTFA Meeting
Sanchari and Filippo attending the 51st International Symposium for Testing and Failure Analysis (ISTFA)
11/13/2025 AFM‑in‑SEM at Arizona State University on 13 November 2025
Thanks all for your participation!
11/9/2025 Congratulations to the whole team for the publication of:
Advances in correlative microscopy and next-generation devices toward the CHIPS Act
11/3/2025 Congratulations to Ashiqur Rahman Laskar for his PhD defense
10/20/2025 Congratulations to Lorenzo Magnarin for his defense
10/15/2025 Congratulations to the team for the paper!
The enduring legacy of scanning spreading resistance microscopy: Overview, advancements, and future directions
10/14/2025 ASU hosts the 2025 Lawrence Symposiu
10/9/2025 Applied Materials and ASU opened the Materials-to-Fab Center
10/7/2025 Arizona welcomed SEMICON West 2025!
10/2/2025 Mid-semester lab dinner, thanks all for joining!
9/18/2025 Naznin Akther joins the group, welcome!
9/7/2025 Lakshmi Sowjanya Vendra joins the group, welcome!
9/1/2025 Michael Kim joins the group, welcome!
9/4/2025 Congratulations to Filippo and the team, on the publication of the article
Physics-informed computer vision assisted defects classifier in transition metal dichalcogenides using electrical atomic force microscopy
8/31/2025 Congratulations to Ashiqur, and the team, on the publication of the article
Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials
8/20/2025 Jose Tapia-Caceres joins the group, welcome!
8/19/2025 Mubin Md Al Furkan joins the group, welcome!
7/11/2025 Productive day and visit at EPFL, thanks Prof. Georg Fantner
Events to attend in 2026
GOMACTech (Government Microcircuit Applications & Critical Technology Conference) – March 9-12 , New Orleans, LA, USA
The 2026 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) -March 16-19, 2026, Monterey, USA
International Scanning Probe Microscopy Congress (ISPM) – May 2026, Genova, Italy
The Symposium on VLSI Technology (VLSI 2026) – June 14-18, HONOLULU, HAWAII
IEEE 33rd INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2026) – July 13-16, Singapore
3D Power Electronics Integration and Manufacturing 3D-PEIM 2026 – November 16-19, 2026, Tempe, AZ
2026 19th International Conference Reliability and Stress-related Phenomena in Nanoelectronics (“STRESS WORKSHOP”) – Sept. 28, WEST LAFAYETTE, INDIANA (USA)
The 72nd Annual IEEE International Electron Devices Meeting – Dec, San Francisco, California, link