Mixed Signal Test Benchmarks
These mixed-signal circuit benchmarks are designed to support research in areas such as Analog/Mixed-signal built-in self-test (BIST) and diagnostic methodologies. The benchmark suite includes a low-dropout regulator (LDO), a phase-locked loop (PLL), and a Sallen–Key filter, along with their associated BIST observation circuits.
All circuits are designed in a TSMC 65 nm technology. The benchmarks represent diverse mixed-signal circuit characteristics: the LDO provides a closed-loop system, the Sallen–Key filter represents an open-loop system, and the PLL provides a high-speed mixed-signal test case. Together, these circuits offer a versatile benchmark set for evaluating and comparing mixed-signal test, diagnosis, and optimization techniques