Facilities
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Temperature Dependent I-V and QE
The CTI-Cryogenics Cryocooler is a closed–cycle liquid helium cooled cryostat. The cold head is mounted on a slide rail for convenient positioning in front of the spectral QE measurement kit for low temperature QE or white light I-V measurements down to 5K. The cold finger accepts 24-pin DIP ceramic packages and other custom mounted samples. A custom Labview interface operates…
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Spectral Quantum Efficiency
The Oriel QE/ICPE Kit is a turn key system from Newport for spectral quantum efficiency measurements of solar cells. It includes a 150W xenon arc lamp, Cornerstone 260 1/4m monochromator complete with chopper and filter wheel attached, current preamplifier, Merlin digital lock-in amplifier, calibrated silicon detector head and TracQ Basic software interface for automated spectral QE measurements. In addition, two…
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Solar Cell Probe Station
The solar cell probe station is equipped with an Oriel Class A Solar Simulator. Solar cell I-V measurements can be performed on a temperature controlled chuck with Keithley 2420 source meter and a CCD microscope for alignment.
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Integration sphere
The integrating sphere collects external radiation from an optical source or device (such as a laser or a light emitting diode) usually for the purpose of flux measurement. Radiation introduced into an integrating sphere is dispersed very uniformly at the sphere walls. The resulting integrated radiation level is directly proportional to the initial radiation level and can be directly measured…
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Time-resolved electroluminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and electroluminescence from 10 K to 400 K with nano second resolution. This system is designed to be integrated with our low-temperature probe station.
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Low-temperature probe station
A TTP4 cryogenic manipulated-proble station is used for non-destructive electrical testing of devices on full and partial wafers up to 2 inches in diameter. Cryogenic operation is based on a continuous-tranfer cryogenic refrigerator specifically for the TTP. The station has a custom designed window and double-fiber optical probe, and the temperature can be varied from 4.2 K to 300 K…
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High-speeding testing
The high-speed lab is equipped with a probe station comprised of high-speed probes and detectors (25 GHz), electrical sources (3 GHz), a sampling oscilloscope, a network analyzer and a light-wave signal analyzer. These allow testing of devices for high speed applications such as optical interconnects, as well as extraction of device operating parameters for better understanding of their performance.
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Laser diode characterization
General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing. Translational stages allow for precise placement of a variety of optical components for quick adaptation allowing a variety of different measurements. Available equipment includes ILX Lightwave LDP-3840 & LDP-3811 Pulsed Current Sources, ILX…
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Processing/Clean Room
Semiconductor device processing is carried out in a 4,000 square foot class-100 cleanroom in the ASU NanoFab facility. List of major equipments and systems Tempress 8-stack furnace tubes configured for: wet and dry thermal oxidation; poly-silicon, low temperature oxide and silicon nitride CVD; phosphorus and boron doping; and the annealing of 4” silicon wafers. Heidelberg DWL 66 Mask Making and…
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Material Characterization
The LeRoy Eyring Center For Solid State Science here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning electron microscopy (SEM) Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and X-ray measurements. List of facilities at the LeRoy Eyring Center For Solid State Science High resolution X-Ray Diffractometer Optical Microscopy Lab Olympus BH2-UMA optical microscope Mititoyo…
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Time-resolved luminescence
[et_pb_section admin_label=”section”] [et_pb_row admin_label=”row”] [et_pb_column type=”4_4″] [et_pb_text admin_label=”Text”] A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and electroluminescence from 10 K to 400 K with nano second resolution. [/et_pb_text] [/et_pb_column] [/et_pb_row]…
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Transmittance and reflectance measurement
A Fourier Transform Infrared Spectrometer (FTIR) equipped with an InGaAs detector, an InSb detector, and an MCT detector is capable of measuring transmittance and reflectance for a wavelength range of 1 to 15 micron. IR FTIP System setup diagram and summary