Material Characterization
The LeRoy Eyring Center For Solid State Science here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning electron microscopy (SEM) Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and X-ray measurements.
List of facilities at the LeRoy Eyring Center For Solid State Science
- High resolution X-Ray Diffractometer
- Optical Microscopy Lab
- Olympus BH2-UMA optical microscope
- Mititoyo Ultraplan FS-110 optical microscope
- Infinivar Depth-of-Field optical microscope
- Hamamatsu Infrared Reflectography system
- Auger Electron Spectroscopy (AES)
- XPS Surface Analysis
- Gaertner L125B Ellipsometer
- Quantum Design MPMS-5S SQUID Magnetometer
- Scanning Probe Microscopy
- FT-IR and FT-Raman spectroscopy
- Raman spectroscopy
- Secondary Ion Mass Spectrometer (SIMS)
- Ion Beam Analysis of Materials
- High Resolution Electron Microscopy
- FEI Nova 200 – SEM/FIB
- FEI Tecnai F20 – TEM/STEM
- FEI XL30 – EFSEM
- JEOL JEM 2000FX – TEM
- JEOL JEM 4000EX – TEM
- JEOL JEM-2010F – TEM/STEM
- JEOL JSM-840 – SEM
- LEO 912-Omega – TEM
- Philips CM200-FEG – TEM/STEM
- Philips EM400ST-FEF – TEM/STEM
- TOPCON 002B – TEM
NOTICE: All equipment is available to external users at reasonable cost. Please contact us for further details.