Testing
High-speeding testing
The high-speed lab is equipped with a probe station comprised of high-speed probes and detectors (25 GHz), electrical sources (3 GHz), a sampling oscilloscope, a network analyzer and a light-wave…
Low-temperature probe station
A TTP4 cryogenic manipulated-proble station is used for non-destructive electrical testing of devices on full and partial wafers up to 2 inches in diameter. Cryogenic operation is based on a…
Integration sphere
The integrating sphere collects external radiation from an optical source or device (such as a laser or a light emitting diode) usually for the purpose of flux measurement. Radiation introduced…
Time-resolved electroluminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns…
Laser diode characterization
General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing…