Facilities
Integration sphere
The integrating sphere collects external radiation from an optical source or device (such as a laser or a light emitting diode) usually for the purpose of flux measurement. Radiation introduced…
Material Characterization
The LeRoy Eyring Center For Solid State Science here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning…
Spectral Quantum Efficiency
The Oriel QE/ICPE Kit is a turn key system from Newport for spectral quantum efficiency measurements of solar cells. It includes a 150W xenon arc lamp, Cornerstone 260 1/4m monochromator complete…
Time-resolved electroluminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns…
Processing/Clean Room
Semiconductor device processing is carried out in a 4,000 square foot class-100 cleanroom in the ASU NanoFab facility.
List of major…
Laser diode characterization
General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing…
MBE chambers
The MBE laboratory is equipped with four solid source MBE chambers for growing III-V and II-VI semiconductor materials. All chambers are equipped for reflection high energy electron diffraction …
Temperature and power-dependent photoluminescence
The photoluminescence setup was recently equiped with a new CCD array detector for measurements in the 200 nm to 1100 nm wavelength range, as well as an InGaAs array for measurements in the 800 nm…
Time-resolved luminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The…
High-speeding testing
The high-speed lab is equipped with a probe station comprised of high-speed probes and detectors (25 GHz), electrical sources (3 GHz), a sampling oscilloscope, a network analyzer and a light-wave…