{"id":906,"date":"2016-02-12T16:27:46","date_gmt":"2016-02-12T23:27:46","guid":{"rendered":"http:\/\/defectlab.engineering.asu.edu\/?page_id=906"},"modified":"2024-03-11T16:25:18","modified_gmt":"2024-03-11T23:25:18","slug":"sinton-lifetime-tester-wct-120ts","status":"publish","type":"page","link":"https:\/\/labs.engineering.asu.edu\/defectlab\/resources-2\/facilities\/sinton-lifetime-tester-wct-120ts\/","title":{"rendered":"Sinton Lifetime Tester WCT-120TS"},"content":{"rendered":"\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-28f84493 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image alignleft size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"450\" height=\"600\" src=\"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-content\/uploads\/sites\/177\/2016\/02\/Sinton.jpg\" alt=\"Sinton\" class=\"wp-image-907\" srcset=\"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-content\/uploads\/sites\/177\/2016\/02\/Sinton.jpg 450w, https:\/\/labs.engineering.asu.edu\/defectlab\/wp-content\/uploads\/sites\/177\/2016\/02\/Sinton-375x500.jpg 375w\" sizes=\"auto, (max-width: 450px) 100vw, 450px\" \/><\/figure>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<p>Sinton lifetime tester is a powerful tool for characterization and optimization of silicon material, including dopant diffusion and passivation quality. It uses an eddy-current conductance sensor and a filtered xenon flash lamp to measure carrier lifetime. Measurements can be taken using either Quasi-Steady-State-Photoconductance (QSSPC) method or Transient PhotoConductance Decay (Transient PCD). The temperature-controlled stage adds the capability to measure the carrier recombination lifetime of silicon wafers at temperatures ranging from 25\u00b0C to 230\u00b0C.<\/p>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p class=\"mb-2\">Sinton lifetime tester is a powerful tool for characterization and optimization of silicon material, including dopant diffusion and passivation quality. It uses an eddy-current conductance sensor and a filtered xenon flash lamp to measure carrier lifetime. Measurements can be taken using either Quasi-Steady-State-Photoconductance (QSSPC) method or Transient PhotoConductance Decay (Transient PCD). The temperature-controlled stage adds&#8230;<\/p>\n","protected":false},"author":339,"featured_media":0,"parent":309,"menu_order":26,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-906","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/pages\/906","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/users\/339"}],"replies":[{"embeddable":true,"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/comments?post=906"}],"version-history":[{"count":0,"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/pages\/906\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/pages\/309"}],"wp:attachment":[{"href":"https:\/\/labs.engineering.asu.edu\/defectlab\/wp-json\/wp\/v2\/media?parent=906"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}