News
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Stay informed about the latest news from our research group
4/30/2024 Team event for the end of spring semester, with Filippo’s farewell party.
4/20/2024 Seyed Amir Ghoreishi joins the group, welcome!
4/11/2024 Paper out, thanks to all the co-authors!
Metrology for 2D materials: a perspective review from the international roadmap for devices and systems
3/20/2024 In the news! here
3/15/2024 Visit to intel (Chandler) thanks to Shankar Devasenathipathy
3/14/2024 Lakshmi Jayant [email protected] joins the group, welcome!
2/20/2024 FUSENANO24 at University of Arizona, Tucson
2/14/2024 Congratulations to Andres Gomes (CSIC) on the publication of the article
“Nano-positive up negative down measurement in binary oxide ferroelectrics”
2/01/2024 Sakib Ahmed [email protected] joins the group, welcome!
1/25/2024 Twish Nitin Sanghvi [email protected] joins the group, welcome!
1/22/2024 Congratulations to Jing Xie on the publication of the article
“Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge Contacts”
1/10/2024 Congratulations to Mark Neisser (Tsinghua University) on the publication of the article
“How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning”
12/14/2023 Great interactions with old and new friends at the 54th IEEE SISC, with Jacopo Franco (imec) and Ashish Penumatcha (intel)
12/05/2023 ASU hosts the minister-president of Flanders and the prime minister of the Netherlands, great interaction with the entire delegations.
11/17/2023 Great week of visits thanks to the presence of ISTFA in Phoenix. Greg Johnson and Michael Foster (Zeiss), Lennaert Wouters (imec) and Oberon Dixon-Luinenburg (Berkeley).
11/10/2023 Congratulations to Deepanjan Sharma (infinitesima-imec) on the publication of the article
“An innovative multi-probe tomographic atomic force microscope for materials research and failure analysis”
11/10/2023 The team is mentioned in Electronic Device Failure Analysis magazine
11/10/2023 Congratulations to Ashiqur Rahman Laskar on the publication of the article
“Scanning probe microscopy in the age of machine learning”
11/6/2023 Mohammad Zaid Kathadi [email protected] joins the group, welcome!
11/1/2023 Filippo Ozino Caligaris [email protected] joins the group, welcome!
10/9/2023 Invited talk at the IEEE International Integrated Reliability Workshop (IIRW)
9/28/2023 Installation week with the visit of Ondřej Novotný
9/19/2023 Plenary talk at Nanoinnovation 2023 – Challenges for nanomaterials in the semiconductor industry of the post-nanometer era
9/01/2023 Bhanu Prasad [email protected] joins the group, welcome!
7/01/2023 Md Fuad Hossain [email protected] joins the group, welcome!
6/19/2023 Jan Neuman CEO of NenoVision visits ASU and the team
5/16/2023 The team visits Macro Technology Works for lab spaces
5/3/2023 Nursultan Maidan [email protected] joins the group, welcome!
4/15/2023 Bhojraj Mukund Khairmode [email protected] joins the group, welcome!
3/30/2023 Susmeet Bakshi [email protected] joins the group, welcome!
3/15/2023 Srijan Chakrabarti [email protected] joins the group, welcome!
2/15/2023 Md Ashiqur Rahman Laskar [email protected] joins the group, welcome!